Jimmie A. Miller, PhD
(Precision Engineering), University of
Warwick, Coventry, England, July 1994.
MSE Engineering (Microelectronics), University of North Carolina at Charlotte, Dec 1987.
BS Physics, University of North Carolina at Charlotte, May 1985.
BS Mathematics, University of North Carolina at Charlotte, May 1985.
AAS Electronics Engineering Technology, Rowan-Cabarrus Community College, Sep 1980.
TECHNICAL INTERESTS AND EXPERTISE:
PROFESSIONAL SOCIETY INVOLVMENT:
American Society for Precision Engineering
(ASPE) Board Member 2016-2018
Director at Large, Chair of the Metrology Systems Committee
Chief Engineer: Center for Precision Metrology @ UNC Charlotte Mar 1993-Present - Responsibilities involve graduate student research consultation and design review, industrial project development, limited supervision of electronics and mechanical technicians, equipment training and repair, equipment budgeting and procurement specification, and general managerial oversight of various precision engineering focus laboratories such as metrology and computer integrated manufacturing. Laboratory renovation and expansion coordinator.
Current Teaching Responsibilities: MEGR 7182, 8182 Machine Tool Metrology
Graduate Research Committees for thesis/dissertation:
PhD: Lucas Valdez Dec 2015, Improved measurement methods for in-process metrology on large scale components
PhD: Mario Valdez Dec 2015, Task specific uncertainty for industrial measurements
PhD: Neil Gardner, April 2007, Precision Geometric Metrology of Refractive Micro-lenses
PhD: Dongmei Ren, Oct 2006, Optical Measurements of Dimensional Instability
PhD: Lei Dong, Oct 2006, In-situ detection and heating of the high pressure phase of silicon during scratching
Masters: Prashanth Jaganmohan, May 2017, Metrology Bench
Masters: Harsh Patel, May 2016, A study of parameters influencing the vehicle wheel alignment measurements
Masters: William Land II, June 2015, Characterization and in-process metrology of a laser powder fusion additive manufacturing machine
Masters: Paul Anderson, Apr 2015, Sub-scale machining of large components
Masters: Victoria Welty, Apr 2015, Dynamic evaluation of laser trackers
Masters: Yue Peng, Mar 2015, Metrological evaluation of size specifications in ISO 144405-1
Masters: Raunak Jadhav, Dec 2013, Error budget software for machine tools
Masters: Kane Lingerfelt, Nov 2013, A study of modulated tool path machining and its effect on tool life in CNC turning operations.
Masters: Wesley Love, Nov 2012, Evaluating CNC machine tool dynamic performance for modulated tool-path (MTP) chip breaking
Masters: Parik Kulkarni, Nov2012 Evaluation of datum reference frame sensitivity and its effect on freeform metrology
Masters: Soumajit Dutta, Aug 2008, Open Metrology Software
Masters: Wichuda Chikosol, Dec 2007, Performance Testing of Cylindricity/Roundness Measuring Machine
Masters: Prashanth Ramu, Dec 2007, Error Evaluation and Uncertainty for a Five-Axis Multi-sensor, Coordinate Measuring Machine
Masters: David Winkowski: 2005, A high precision temperature controlled vacuum chamber for use in a dilatometer with sub-nanometer resolution.
STM Nanomemory Project, UNC Charlotte Aug 1989 - Dec 1992 Investigating the feasibility of producing a new type of memory with storage density 104 - 106 times greater than current technology. The project involved using scanning tunneling microscopy techniques to modify surfaces at the nanometer level. Other STM research included examining the wear pattern on cutting tools, process dependence of plasma enhanced chemical vapor deposition of germanium on silicon and diamond on silicon.
Research Organizational Assistant, UNC Charlotte Jan 1989 - Aug 1989 Assisted Dr. Robert Hocken (Distinguished Professor) in the logistics involved in establishing the UNC Charlotte Precision Engineering Laboratory. Duties included technical diagramming for funded research, and writing specifications and contacting suppliers of research equipment, and other support functions. Microelectronics Research, UNC Charlotte Sep 1986 - May 1988 Clean room fabrication of metal-oxide-silicon capacitors; parametrical testing using capacitance vs. voltage, conductance, and charge-capacitance techniques; obtaining doping profiles, and interface trap and oxide charge densities; bias temperature aging and hot carrier injection into oxides; data acquisition and computer programming.
Physics Laboratory Instructor, UNC Charlotte Aug 1983 - May 1985 Teaching and grading an undergraduate middle level physics mechanics laboratory at UNCC.
Electronics Tester and Troubleshooter, Western Electric Oct 1980 - Aug 1981 Structured testing of telephone trunk line system components with board level troubleshooting.
US# 6,782,596 "Fiducial calibration systems and
methods for manufacturing, inspection, and assembly" Miller, Jimmie A., Aug
US# 7,073,239 "Fiducial calibration and
method for assembling parts" Miller, Jimmie A., July , 11, 2006
US# 7,065,851 "Fiducial Calibration Method
for measuring a workpiece" Miller, Jimmie A., June 27, 2006
"Dual-axis static and dynamic force
characterization device." Pereira; Paulo H. (Peoria, IL); Muralidhar; Ashok
(Minneapolis, MN); Hocken; Robert J. (Concord, NC); Miller; Jimmie A.
(Salisbury, NC); Smith; Stuart (Charlotte, NC). August 20, 2002.
TECHNICAL JOURNAL & REFEREED PUBLICATIONS:
Jimmie Miller, Two-dimensional matrix-based non-complex axis-of-rotation
error modeling, Precision Engineering, (44)
April 2016, Pp 93-108,
Datasets for Figures at http:dx.doi.org/10.17632/3bjr99z62n.1
Jimmie Miller, Soumajit Dutta, Edward Morse and José Yague-Fabra , "Effective
stylus diameter determination using near zero-width reference"
Precision Engineering 35((3) 2011, p 500-504.
P. Ramua, J.A. Yagüe,
R.J. Hocken and J. Miller, "Development
of a parametric model and virtual machine to estimate task specific measurement
uncertainty for a five-axis multi-sensor coordinate measuring machine
Precision Engineering 35((3) 2011, p 431-9.
Joao Bosco de Aquino Silva , Robert J. Hocken, Jimmie A. Miller, Gregory W.
Caskey and Prashanth Ramu, "Approach for
uncertainty analysis and error evaluation of four-axis co-ordinate measuring
The International Journal of Advanced Manufacturing Technology: Volume 41, Issue11 (2009), Page 1130
Dongmei Ren, K M Lawton and Jimmie A Miller, "A
double-pass interferometer for measurement of dimensional changes",
Measurement Science and Technology, 19/2 (2008) 531-534. (MST featured
Bethany A. Woody, K. Scott Smith, Robert J. Hocken, and Jimmie A. Miller,
"A Technique for Enhancing Machine Tool Accuracy
by Transferring the Metrology Reference From the Machine Tool to the Workpiece"
Journal of Manufacturing Science and Engineering -- June 2007 -- Volume 129,
Issue 3, pp. 636-643 (2009
ASME Blackall Machine Tool and Gage Award)
Dongmei Ren, Kevin M. Lawton and Jimmie A. Miller, "Application of
cat's-eye retroreflector in micro-displacement measurements" Precision
Engineering, Vol 31, Issue 1, January 2007, Pages 68-71.
S. Smith , B.A. Woody, J.A. Miller, "Improving the Accuracy of Large Scale
Monolithic Parts Using Fiducials" Annals of the CIRP Vol. 54/1/2005,
Lei Dong, John A. Patten, Jimmie A. Miller, "In-situ infrared detection and
heating of metallic phase of silicon during scratching test" , Int. J.
Manufacturing Technology and Management, Vol. 7, Nos. 5/6, pp530-539
Miller, Jimmie. A., Hocken, Robert, Smith, Stuart T., and Harb, Salaam,
"X-ray calibrated tunneling system utilizing a dimensionally stable nanometer
positioner", Precision Engineering, 18(2/3), pp. 95-102 (1996).
Varhue, W. J., Carulli, J. M., Peterson, G. G., and Miller, J. A., "Low
temperature epitaxial growth of Ge using electron-cyclotron-resonance
plasma-assisted chemical vapor deposition", J. Appl. Phys. 71(4), 1949,
Varhue, J., Carulli, J. M., Miller, J. A., and Peterson, G. G., "Surface
morphology of epitaxial Ge on Si grown by plasma enhanced chemical vapor
deposition", J. Vac. Sci. Tech. B 9(4) 2202 (1991).
Miller, Jimmie A. and Hocken, Robert J. "Scanning tunneling microscopy bit
making on highly oriented pyrolytic graphite: initial results", J. Appl. Phys.
68(2), 905 (1990).
Miller, Jimmie A., Blat, Catherine, and Nicollian, Edward H.,"Accurate
measurement of trivalent silicon interface trap density using small signal
steady state methods", J. Appl. Phys. 66(2), 716 (1989).
Miller, Jimmie, "Scope of Metrology Systems", Proceedings of the American Society for Precision Engineering Annual Meeting, Portland OR, Oct 23-28, 2016, 65, pp140-5
Du J, Kang W, Bridges P, Miller JA, "Experimental Verification of Alignment Related Errors in Position Metrology of Axes of Rotation", Proc ASPE 2015, 62, 474-9.
Miller, J. A.; Caskey, G. W.; Hocken, R. J. "Optical alignement of SAMM to reduce cosine error" Proceedings of the ASPE 2011, 52, 238-41.
Ni, K.; Miller, J. A.; Hocken, R. J. ,"Metrology of a Precision Plasmonic Lithography Stage", Proceedings of the ASPE 2011, 52, 532-44
Miller JA, Saad ME-S, Caskey GW, Aguilar-Martin, "Interferometric
measurement of the low value CTE of a ball bar", Proceedings of the ASPE
2010 Annual Meeting
Ren, D. M., Lawton, K. M., Miller, J. A., Zhu, Z. Y., & Wan, Y. (2009). The design of the optical system in the balanced interferometers. Jiliang Xuebao/Acta Metrologica Sinica, 30(SUPPL. 1), 1-4. 10.3969/j.issn.1000-1158.2009.z1.01
D. Ren, J. A. Miller and K. M. Lawton, "Uncertainty in measurements of dimensional changes from an interferometric dilatometer", Proceedings of the ASPE 2007 Annual Meeting, Dallas, TX, pp. 340-343. http://www.aspe.net/publications/Annual_2007/POSTERS/3METRO/3MEASU/2233.PDF
Ren D., Lawton K.M. and Miller J.A., "Application of cat's-eye retroreflector
in micro-displacement measurement", Proceedings of the ASPE 2005 Annual Meeting, vol (37), Oct. 9-14, 2005, Norfolk, VA, pp. 379-382.
Lei Dong, John A. Patten, and Jimmie A. Miller, "In-Situ Infrared (IR) Detection and Heating of the High Pressure Phase of Silicon During Scratching Test" in Surface Engineering 2004-Fundamentals and Applications, edited by Soumendra N. Basu, James E. Krzanowski, Joerg Patscheider, and Yury Gogotsi (Mater. Res. Soc. Symp. Proc. 843, Warrendale, PA , 2005), T6.5/R10.5
Woody, BA;S mith, KS; Hocken, RJ; Miller, JA "Uncertainty analysis for
the Fiducial Calibration System" ASME International Mechanical Engineering
Congress and Exposition, NOV 05-11, 2005 Manufacturing Engineering and Materials
Handling, 2005 Pts A and B 16: 699-706 Part 1-2 2005
Miller, Jimmie A, Morse, Edward P, Nettles, John A, Turner, Jeremy S, " Kite
Square", Proceedings of the ASPE 2004 Annual Meeting, Oct 24-29, 2004, vol 34
(2004) pp 450-454.
Dong, Lei; Miller, Jimmie A; Patten, John A,; "In-situ infrared (IR)
detection of the high pressure phase transformation of silicon during scratching
test", Proceedings of the ASPE 2004 Annual Meeting, Oct 24-29, 2004, vol 34
(2004) pp 137-140.
Patten, John A,; Dong, Lei; Miller, Jimmie A; "Electrical and optical
detection and heating of the high pressure metallic phase of silicon during
scratching with diamond and its effect on the material's hardness", Proceedings
of the ASPE 2003 Annual Meeting, Oct 26-31, 2003, vol 30 (2003) pp 507-510.
Feng , Qibo; Hocken, Robert J.; Miller, Jimmie A.; "Quick and dynamic
measurements of geometric errors of CNC machines", in Process Control and
Inspection for Industry Proceedings of SPIE vol 4222 (2000) pp 110-113.
Miller, Jimmie A.; Hocken, Robert; Feng, Qibo; and Ramanan, Vignesh;
"Foundation for Dynamic Metrology of Machine Tools" Proceedings of the ASPE 1999
Annual Meeting, Oct 31- Nov 4, 1999, in Monterey California.
Salsbury James; Hocken, Robert; Miller, Jimmie; and Raja, Jay; "Graduate Level Education in Metrology", Proceedings of the 1999 NCSL Workshop and Symposium, July 1999, pp 351-362.
Hocken, R., and Miller, J. A., "Nanotechnology in metrology", Proceedings of the Fifth International Symposium on Robotics and Manufacturing, August 14-18, 1994 in Maui, Hawaii.
Hocken, R. et al., "Research in engineering metrology…" Proceedings of NSF Design and Manufacturing Conferences, 1993 and 1994.
Miller, J. A., Smith., S.T., "Tunneling current characterization: An application of an X-ray interferometric calibrated stage," Proceedings of the ASPE 1993Annual Meeting, Nov 1993, pp. 37-40.
Hocken, Robert J., and Miller,. Jimmie A., " Nanotechnology and its impact on manufacturing", Japan/USA Symposium on Flexible Automation ASME 1992, p 7ff.
Lavigne, C., Miller, J. A., and Hocken., R. J. , "A long range STM/AFM" Proceedings of the ASPE 1991 Annual Conference, Santa Fe, NM, Oct 1991.
Miller, J. A., Hocken, R., "Scanning tunneling microscopy bit-making for use in high density memory chip applications," Proceedings of the ASPE 1990 Annual Conference, Nov 1990, pp. 119-120.
PhD THESIS: "From STM to Nanomemory: A Transfer of Technology Feasibility Study". University of Warwick, Coventry, England, Engineering Dept., 1994.
MASTERS THESIS: "Negative bias temperature instability in wet and dry oxides". University of North Carolina Charlotte, Engineering Science Dept., 1987.
SOCIETY MEMBERSHIP Member of the American Society for Precision Engineering (ASPE).
HONORS AND AWARDS:
COMMUNITY INVOLVEMENT: Currently a member of Concord Bible Church, Concord NC.