Jimmie A. Miller,
PhD
Chief Engineer, Center for Precision Metrology, Graduate Faculty
The University of North Carolina at Charlotte
704.687.8312
jamiller@uncc.edu
EDUCATION:
PhD Engineering (Precision Engineering), University
of Warwick, Coventry, England, July 1994.
MSE Engineering (Microelectronics), University of North Carolina at Charlotte, Dec 1987.
BS Physics, University of North
Carolina at Charlotte, May 1985.
BS Mathematics, University of North
Carolina at Charlotte, May 1985.
AAS Electronics Engineering Technology, Rowan-Cabarrus Community College, Sep 1980.
PhD THESIS: "From STM to
Nanomemory: A Transfer of Technology Feasibility Study". University of Warwick, Coventry, England,
Engineering Dept., 1994. (Most of this research was completed at UNC Charlotte)
Available via NinerCommons : https://ninercommons.uncc.edu/islandora/object/work%3A64
MASTERS THESIS: "Negative bias temperature instability in wet and dry oxides". University of North Carolina Charlotte, Mechanical Engineering and Engineering Science Dept., 1987.
TECHNICAL INTERESTS AND EXPERTISE:
¤
Metrology
Systems
¤
Metrology
of Machine Tools
¤
Dimensional
(3D , Length) Metrology (Nanoscale to Large Scale)
¤ Optical Metrology
¤
Mathematical
Modeling of Systems (Metrology, Sensors, Geometric, Calibration etc)
PROFESSIONAL SOCIETY AND STANDARDS INVOLVMENT:
American Society for Precision
Engineering (ASPE)
Member since 1991
Board Member 2016-18
Director at Large, Chair (2016-18) of the Metrology Systems Committee
Tutorial presenter at annual meetings (various dates)
American Society of Mechanical Engineers
B5 TC52 Standards Committee
B5.64 Methods for the Performance
Evaluation of Single Axis Linear Positioning Systems (Drafting)
BOOK CHAPTER :
Metrology in
Basics of Precision Engineering
, Leach and Smith Eds. 2018 ISBN
9781498760850
EMPLOYMENT HISTORY:
Chief Engineer: Center for Precision Metrology @ UNC Charlotte Mar 1993-Present - graduate student research consultation and design review, industrial project development, limited supervision of electronics and mechanical technicians, equipment training and repair, equipment budgeting and procurement specification, and general managerial oversight of various precision engineering focus laboratories such as metrology and computer integrated manufacturing. Laboratory renovation and expansion coordinator.
Teaching Activities:
¤
MEGR 7182,
8182 Machine Tool Metrology (Metrology Certificate Core)
¤
Senior design
mentor/grader
¤
MEGR 3090
Topics: Metrology and Precision Engineering, Co-lecturer (3 periods)
Graduate Research Committee participation: thesis (21) / dissertation (14) identified later
STM Nanomemory Project, UNC Charlotte Aug 1989 - Dec 1992 Investigating the feasibility of producing a new type of memory with storage density 104 - 106 times greater than current technology. The project involved using scanning tunneling microscopy techniques to modify surfaces at the nanometer level. Other STM research included examining the wear pattern on cutting tools, process dependence of plasma enhanced chemical vapor deposition of germanium on silicon and diamond on silicon.
Research Organizational Assistant, UNC Charlotte Jan 1989 - Aug 1989 Assisted Dr. Robert Hocken (Endowed Distinguished Professor) in the logistics involved in establishing the UNC Charlotte Precision Engineering Laboratory. Duties included technical diagramming for funded research, and writing specifications and contacting suppliers of research equipment, and other support functions. Microelectronics Research, UNC Charlotte Sep 1986 - May 1988 Clean room fabrication of metal-oxide-silicon capacitors; parametrical testing using capacitance vs. voltage, conductance, and charge-capacitance techniques; obtaining doping profiles, and interface trap and oxide charge densities; bias temperature aging and hot carrier injection into oxides; data acquisition and computer programming.
Physics Laboratory Instructor, UNC Charlotte Aug 1983 - May 1985 Teaching and grading an undergraduate middle level physics mechanics laboratory
Electronics Tester and Troubleshooter, Western Electric Oct 1980 - Aug 1981 Structured testing of telephone trunk line system components with board level troubleshooting.
PATENTS:
Invention Disclosure (July 2020): "Reference Artifact for
Straightness, Squareness, Parallelism, and Positioning RASSPP",
UNCC#2021-001
Provisional Patent (July 2021) US# 63/209,165 Piggyback superstructures for
precision machining and metrology
US# 6,782,596 "Fiducial calibration systems and methods for
manufacturing, inspection, and assembly" Miller, Jimmie A., Aug 31, 2004
http://www.google.com/patents?q=6782596&btnG=Search+Patents
US# 7,073,239 "Fiducial calibration and method for assembling
parts" Miller, Jimmie A., July , 11, 2006
http://www.google.com/patents?q=7073239&btnG=Search+Patents
US# 7,065,851 "Fiducial Calibration Method for measuring a
workpiece" Miller, Jimmie A., June 27,
2006
http://www.google.com/patents?q=7065851&btnG=Search+Patents
US# 6,434,845 "Dual-axis static and dynamic force characterization
device." Pereira; Paulo H. (Peoria,
IL); Muralidhar; Ashok (Minneapolis, MN); Hocken; Robert J. (Concord, NC);
Miller; Jimmie A. (Salisbury, NC); Smith; Stuart (Charlotte, NC). August
20, 2002.
http://www.google.com/patents?q=6434845&btnG=Search+Patents
JOURNAL REVIEWS (>200) for (>20) JOURNALS :
Web
of Science statistics
1 of 4 (out of several hundred) acknowledged for "exceptional
performance" in 2019
and 2020 by the
journal Precision
Engineering
TECHNICAL JOURNAL & REFEREED PUBLICATIONS:
Liuqing Yang,
Youxing Chen, Jimmie Miller, William J. Weber, Hongbin Bei, Yanwen Zhang, “Deformation mechanisms in single crystal Ni-based
concentrated solid solution alloys by nanoindentation”, Materials
Science and Engineering: A,
856, 2022, 143685 https://doi.org/10.1016/j.msea.2022.143685
Jimmie Miller "Symmetry centering of artifacts on limited-range
rotary carriages or joints"
Precision Engineering, 77, 2022, Pp
40-45,
https://doi.org/10.1016/j.precisioneng.2022.05.001
Qichang Wang, Jimmie Miller, Axel Von Freyberg, Norbert Steffens, Andreas Fischer, Gert Goch, "Error mapping of rotary tables in 4-axis measuring devices using a ball plate artifact",CIRP Annals 67(1) 2018 pp 559-62, https://doi.org/10.1016/j.cirp.2018.04.005
Jimmie Miller, "Two-dimensional matrix-based non-complex axis-of-rotation
error modeling", Precision Engineering, (44)
April 2016, Pp 93-108,
http://dx.doi.org/10.1016/j.precisioneng.2015.10.007
(http://www.sciencedirect.com/science/article/pii/S0141635915002111)
Datasets for Figures at http:dx.doi.org/10.17632/3bjr99z62n.1
Jimmie Miller, Soumajit Dutta, Edward Morse
and José Yague-Fabra , "Effective
stylus diameter determination using near zero-width reference" Precision
Engineering 35(3) 2011, p 500-504.
http://dx.doi.org/j.precisioneng.2011.02.003
P. Ramua,
J.A. Yagüe, R.J. Hocken and J. Miller, "Development of a parametric model and virtual machine to estimate
task specific measurement uncertainty for a five-axis multi-sensor coordinate
measuring machine " Precision Engineering 35((3) 2011, p
431-9.
http://dx.doi.org/j.precisioneng.2011.01.003
Joao Bosco de Aquino Silva , Robert J.
Hocken, Jimmie A. Miller, Gregory W. Caskey and Prashanth Ramu, "Approach for uncertainty analysis and error
evaluation of four-axis co-ordinate measuring machines (CMMs)"
The International Journal of Advanced Manufacturing Technology:
Volume 41, Issue11 (2009), Page 1130
http://dx.doi.org/10.1007/s00170-008-1552-z
http://www.springerlink.com/content/n785p53m5r02n07h
Dongmei Ren, K M Lawton and Jimmie A
Miller, "A double-pass
interferometer for measurement of dimensional changes",
Measurement Science and Technology, 19/2 (2008) 531-534. (MST featured
article)
http://dx.doi.org/10.1088/0957-0233/19/2/025303
http://www.iop.org/EJ/abstract/0957-0233/19/2/025303
Bethany A. Woody, K. Scott Smith, Robert J.
Hocken, and Jimmie A. Miller, "A
Technique for Enhancing Machine Tool Accuracy by Transferring the Metrology
Reference From the Machine Tool to the Workpiece" Journal
of Manufacturing Science and Engineering -- June 2007 -- Volume 129, Issue 3,
pp. 636-643 (2009
ASME Blackall Machine Tool and Gage Award)
http://dx.doi.org/10.1115/1.2716718
Dongmei Ren, Kevin M. Lawton and Jimmie A.
Miller, "Application of cat's-eye
retroreflector in micro-displacement measurements" Precision
Engineering, Vol 31, Issue 1, January 2007, Pages 68-71.
:http://dx.doi.org/10.1016/j.precisioneng.2006.02.002
S. Smith , B.A. Woody, J.A. Miller,
"Improving the Accuracy of Large Scale
Monolithic Parts Using Fiducials" Annals of the CIRP Vol.
54/1/2005, pp483-7.
http://dx.doi/S0007-8506(07)60150-4
Lei Dong, John A. Patten, Jimmie A. Miller,
"In-situ infrared detection and
heating of metallic phase of silicon during scratching test" ,
Int. J. Manufacturing Technology and Management, Vol. 7, Nos. 5/6,
pp530-539 (2005)
http://dx.doi.org/10.1504/IJMTM.2005.007701
Miller, Jimmie. A., Hocken, Robert, Smith,
Stuart T., and Harb, Salaam, "X-ray
calibrated tunneling system utilizing a dimensionally stable nanometer
positioner", Precision Engineering, 18(2/3), pp. 95-102 (1996).
http://dx.doi.org/10.1016/0141-6359(96)00037-2
Varhue, W. J., Carulli, J. M., Peterson, G.
G., and Miller, J. A., "Low
temperature epitaxial growth of Ge using electron-cyclotron-resonance
plasma-assisted chemical vapor deposition", J. Appl. Phys. 71(4),
1949, (1992).
http://dx.doi.org/10.1063/1.351189
Varhue, J., Carulli, J. M., Miller, J. A.,
and Peterson, G. G., "Surface
morphology of epitaxial Ge on Si grown by plasma enhanced chemical vapor
deposition", J. Vac. Sci. Tech. B 9(4) 2202 (1991).
http://dx.doi.org/10.1116/1.585770
Miller, Jimmie A. and Hocken, Robert J. "Scanning tunneling microscopy bit making on highly oriented
pyrolytic graphite: initial results", J. Appl. Phys. 68(2), 905
(1990).
http://dx.doi.org/10.1063/1.346732
Miller, Jimmie A., Blat, Catherine, and
Nicollian, Edward H.,"Accurate measurement of trivalent silicon interface trap density
using small signal steady state methods", J. Appl. Phys. 66(2),
716 (1989).
http://dx.doi.org/10.1063/1.343544
CONFERENCE PROCEEDINGS
Kuldeep Mandloi, Chris Evans, Jason Fox,
Harish Cherukuri, Jimmie Miller, Angela Allen, Jeff Raquet, Brian Dutterer, Heat
transfer characteristics of additively manufactured surfaces: an experimental
and computational study, ASPE summer topical, Advancing Precision in
Additive Manufacturing, July 2022.
Kuldeep Mandloi,, Chris Evans, Jason C.
Fox, Harish Cherukuri, Jimmie Miller, Angela Allen, David C. Deisenroth, Alkan
Donmez, Toward specification of complex additive manufactured metal
surfaces for optimum heat transfer, Joint special interest group,
Precision in Additive Manufacturing EUSPEN ASPE, Switzerland 2021
https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=93280
Vogl, G. W. (NIST)); Fesperman, R.R.(Corning); Ludwick, S. J. (Aerotech); Klopp, R.W. (Exponent); Grabowski, A. (Physik Instrumente); Lebel, J. (Renishaw); Miller, J.A. (UNC Charlotte); Brown, N. L. (ALIO); Belski, E.; Duncan, N. (Aerotech); Hennessey, C.W. (ALIO)", Development of a New Standard for the Performance Evaluation of Single Axis Linear Positioning Systems", Proceedings of the ASPE Annual Meeting, (2020) pp128-133 https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=930937
Laura Hopper, Todd Noste, Jimmie Miller, Chris Evans, "Error sources, compensation, and probe path optimization for on-machine metrology of freeform optics," Proc. SPIE 11487, Optical Manufacturing and Testing XIII, 1148709 (20 August 2020); https://doi.org/10.1117/12.2568797
Todd Noste, Chris J. Evans, Jimmie A. Miller, and Laura E. Hopper "Concurrent engineering of a next-generation freeform telescope: metrology and test", Proc. SPIE 10998, Advanced Optics for Imaging Applications: UV through LWIR IV, 109980Y (14 May 2019); doi: 10.1117/12.2519162;
T. Noste, L. Hopper, J. Miller, C. Evans, “Task specific uncertainty in measurement of freeform optics” Proc. Euspen, Bilbao, Spain (2019). https://www.euspen.eu/knowledge-base/ICE19215.pdf
Wang, Q., Miller, J., Groover,
J., Goch, G.. "Experimental verification of an error
mapping technique for rotary tables/axes" , Proceedings - 33rd
ASPE Annual Meeting 2018, Pages 21-25
https://www.xcdsystem.com/aspe/files/Final%20ASPE%20AM%202018%20Proceedings.pdf
Miller, Jimmie, "Scope of Metrology Systems", Proceedings of the American Society for Precision Engineering Annual Meeting, Portland OR, Oct 23-28, 2016, 65, pp140-5 (2) (PDF) Scope of Metrology Systems (researchgate.net)
Du J, Kang W, Bridges P, Miller JA, "Experimental Verification of Alignment Related Errors in Position Metrology of Axes of Rotation", Proc ASPE 2015, 62, 474-9. https://www.xcdsystem.com/aspe/files/2015%20ASPE%20Annual%20Meeting%20Proceedings.pdf
Miller, J. A.; Caskey, G. W.; Hocken, R. J. "Optical alignment of SAMM to reduce cosine error" Proceedings of the ASPE 2011, 52, 238-41. https://www.xcdsystem.com/aspe/files/ASPE_2011%20AM.pdf
Ni, K.; Miller, J. A.; Hocken, R. J. ,"Metrology of a Precision Plasmonic Lithography Stage", Proceedings of the ASPE 2011, 52, 532-34. https://www.xcdsystem.com/aspe/files/ASPE_2011%20AM.pdf
Miller JA, Saad ME-S, Caskey GW, Aguilar-Martin, "Interferometric measurement of the low value CTE of a ball bar", Proceedings of the ASPE 2010 Annual Meeting. https://www.xcdsystem.com/aspe/files/ASPE_2010%20AM.pdf
Ren, D. M., Lawton, K. M., Miller, J. A., Zhu, Z. Y., & Wan, Y. (2009). The design of the optical system in the balanced interferometers. Jiliang Xuebao/Acta Metrologica Sinica, 30(SUPPL. 1), 1-4. 10.3969/j.issn.1000-1158.2009.z1.01
D. Ren, J. A. Miller and K. M. Lawton, "Uncertainty in measurements of dimensional changes from an interferometric dilatometer", Proceedings of the ASPE 2007 Annual Meeting, Dallas, TX, pp. 340-343. https://www.xcdsystem.com/aspe/files/ASPE_2007.AM.pdf
Ren D., Lawton K.M. and Miller J.A., "Application of cat's-eye retroreflector in micro-displacement measurement", Proceedings of the ASPE 2005 Annual Meeting, vol (37), Oct. 9-14, 2005, Norfolk, VA, pp. 379-382.
Lei Dong, John A. Patten, and Jimmie A. Miller, "In-Situ Infrared (IR) Detection and Heating of the High Pressure Phase of Silicon During Scratching Test" in Surface Engineering 2004-Fundamentals and Applications, edited by Soumendra N. Basu, James E. Krzanowski, Joerg Patscheider, and Yury Gogotsi (Mater. Res. Soc. Symp. Proc. 843, Warrendale, PA , 2005), T6.5/R10.5
Woody, BA; Smith, KS; Hocken, RJ; Miller,
JA "Uncertainty analysis for the Fiducial Calibration
System" ASME International Mechanical Engineering Congress and
Exposition, NOV 05-11, 2005 Manufacturing Engineering and Materials Handling,
2005 Pts A and B 16: 699-706 Part 1-2 2005
http://dx.doi.org/10.1115/IMECE2005-81299
Miller, Jimmie A, Morse, Edward P, Nettles, John A, Turner, Jeremy S, " Kite Square", Proceedings of the ASPE 2004 Annual Meeting, Oct 24-29, 2004, vol 34 (2004) pp 450-454. https://www.xcdsystem.com/aspe/files/ASPE_2004.AM.pdf
Dong, Lei; Miller, Jimmie A; Patten, John A,; "In-situ infrared (IR) detection of the high pressure phase transformation of silicon during scratching test", Proceedings of the ASPE 2004 Annual Meeting, Oct 24-29, 2004, vol 34 (2004) pp 137-140. https://www.xcdsystem.com/aspe/files/ASPE_2004.AM.pdf
Patten, John A,; Dong, Lei; Miller, Jimmie A; "Electrical and optical detection and heating of the high pressure metallic phase of silicon during scratching with diamond and its effect on the material's hardness", Proceedings of the ASPE 2003 Annual Meeting, Oct 26-31, 2003, vol 30 (2003) pp 507-510. https://www.xcdsystem.com/aspe/files/ASPE_2003.AM.pdf
Feng , Qibo; Hocken, Robert J.; Miller,
Jimmie A.; "Quick and dynamic measurements of geometric
errors of CNC machines", in Process Control and Inspection for
Industry Proceedings of SPIE vol 4222 (2000) pp 110-113.
http://dx.doi.org/10.1117/12.403838
Miller, Jimmie A.; Hocken, Robert; Feng, Qibo; and Ramanan, Vignesh; "Foundation for Dynamic Metrology of Machine Tools" Proceedings of the ASPE 1999 Annual Meeting, Oct 31- Nov 4, 1999, in Monterey California. https://www.xcdsystem.com/aspe/files/ASPE_1999.AM.pdf
Salsbury James; Hocken, Robert; Miller, Jimmie; and Raja, Jay; "Graduate Level Education in Metrology", Proceedings of the 1999 NCSL Workshop and Symposium, July 1999, pp 351-362.
Hocken, R., and Miller, J. A., "Nanotechnology in metrology", Proceedings of the Fifth International Symposium on Robotics and Manufacturing, August 14-18, 1994 in Maui, Hawaii.
Hocken, R. et al., "Research in engineering metrology…" Proceedings of NSF Design and Manufacturing Conferences, 1993 and 1994.
Miller, J. A., Smith., S.T., "Tunneling current characterization: An application of an X-ray interferometric calibrated stage," Proceedings of the ASPE 1993Annual Meeting, Nov 1993, pp. 37-40. https://www.xcdsystem.com/aspe/files/ASPE_1993%20AM.pdf
Hocken, Robert J., and Miller,. Jimmie A., " Nanotechnology and its impact on manufacturing", Japan/USA Symposium on Flexible Automation ASME 1992, p 7ff.
Lavigne, C., Miller, J. A., and Hocken., R. J. , "A long range STM/AFM" Proceedings of the ASPE 1991 Annual Conference, Santa Fe, NM, Oct 1991.
Miller, J. A., Hocken, R., "Scanning tunneling microscopy bit-making for use in high density memory chip applications," Proceedings of the ASPE 1990 Annual Conference, Nov 1990, pp. 119-120. https://www.xcdsystem.com/aspe/files/ASPE_1990.pdf
SOCIETY MEMBERSHIP Member of the American Society for Precision Engineering (ASPE).
HONORS AND AWARDS:
GRADUATE RESEARCH COMMITTEES
participation for thesis/dissertation:
PhD: Kuldeep Mandloi
(In-progress) Investigation of thermal and fluid flow characteristics of AM
surfaces with different build angles through CFD and experiments
PhD: Prithiviraj Shanmugam (In progress) Variable shearing
holography
PhD, Abolfazl (Milad) Hosseinpour, Dec 2022, Improved
fidelity of triangulation sensor measurements in optical inspection
PhD: Jacob Cole Mar 2022 Characterization of surfaces by
X-ray reflectometry
PhD: Chunjie Fan Aug 2021 Controlling force and
displacement: Instrumentation design and application in thermal actuation and
nanoindentation
PhD Kumar Arumugam, May 2021, Implementation and evaluation
of optical and stylus based profiling Techniques for surface metrology
PhD: Dustin Gurganus July 2021, Manufacturing methodologies
and optomechanics for dynamic freeform optics
PhD: Kumar Arumugam, April 2021,
Implementation and evaluation of optical and stylus-based profiling techniques
for surface metrology
PhD, Todd Noste, Dec 2020, Freeform
optical surface form metrology with serial data acquisition
PhD, Prashanth Jaganmohan, Dec 2020,
Data processing, modeling, and error analysis in discrete part geometric
inspection
PhD: Masoud Arablu May 2019, Polydyne
displacement interferometer using frequency-modulated light
PhD: Qichang Wang April 2019,
Performance investigation of rotary tables in large scale metrology
PhD: Farid Javidpour April 2019,
Quantification of profile measurement data
PhD: Michael Uwakwe, Feb 2018,
Minimizing task-specific uncertainty in CMM based freeform optics metrology
PhD: Saeed Heysiattalab July 2017, Data
models to support metrology
PhD: Lucas Valdez Dec 2015,
Improved measurement methods for in-process metrology on large scale components
PhD: Mario Valdez Dec 2015, Task
specific uncertainty for industrial measurements
PhD: Neil Gardner, April 2007, Precision
Geometric Metrology of Refractive Micro-lenses
PhD: Dongmei Ren, Oct 2006, Optical
Measurements of Dimensional Instability
PhD: Lei Dong, Oct 2006, In-situ detection
and heating of the high pressure phase of silicon during scratching
Masters: Ryan Gorman Dec 2022 Detection and classification of defects in metal parts using ATOS 2019
Masters: Steven Swagler April 2022 Ultraprecision diamond machining of polycarbonate complex multi-sided freeform optics
Masters: Cecil (DJ) Hastings, July 2021, Development of an all-fiber homodyne laser interferometer for integration into a compact thermal actuator
Masters: Alyson Light, November, 2020, Optical instrumentation using geometric phase elements
Masters: Robert Turnbull, April 2020, An investigation of structured light scanner calibration
Masters: Attilio (AJ) Minnuti, March 2020, Industry implications of ASME Y14.5-2018 rules(s) and the "nested" principle
Masters: Abhinav Mishra, Sept 2019, A modified self-interference based incoherent digital holographic recording system
Masters: Corbin Grohol Sep 2018, Toward fixtureless inspection of automotive fenders
Masters: Jesse Groover, Nov 2018, Generation milling of cylindrical involute gears
Masters: Prashanth Jaganmohan, May 2017, Metrology Bench
Masters: Harsh Patel, May 2016, A study of parameters influencing the vehicle wheel alignment measurements
Masters: William Land II, June 2015, Characterization and in-process metrology of a laser powder fusion additive manufacturing machine
Masters: Paul Anderson, Apr 2015, Sub-scale machining of large components
Masters: Victoria Welty, Apr 2015, Dynamic evaluation of laser trackers
Masters: Yue Peng, Mar 2015, Metrological evaluation of size specifications in ISO 144405-1
Masters: Raunak Jadhav, Dec 2013, Error budget software for machine tools
Masters: Kane Lingerfelt, Nov 2013, A study of modulated tool path machining and its effect on tool life in CNC turning operations.
Masters: Wesley Love, Nov 2012, Evaluating CNC machine tool dynamic performance for modulated tool-path (MTP) chip breaking
Masters: Parik Kulkarni, Nov2012 Evaluation of datum reference frame sensitivity and its effect on freeform metrology
Masters: Soumajit Dutta, Aug 2008, Open Metrology Software
Masters: Wichuda Chikosol, Dec 2007, Performance Testing of Cylindricity/Roundness Measuring Machine
Masters: Prashanth Ramu, Dec 2007, Error Evaluation and Uncertainty for a Five-Axis Multi-sensor, Coordinate Measuring Machine
Masters: David Winkowski: 2005, A high precision temperature controlled vacuum chamber for use in a dilatometer with sub-nanometer resolution.