Jimmie A. Miller, PhD
    704.687.8312 
    jamiller@uncc.edu



EDUCATION:

PhD Engineering (Precision Engineering), University of Warwick, Coventry, England, July 1994.
MSE Engineering (Microelectronics),  University of North Carolina at Charlotte, Dec 1987.
BS Physics, University of North Carolina at Charlotte, May 1985.
BS Mathematics,  University of North Carolina at Charlotte, May 1985.
AAS Electronics Engineering Technology,  Rowan-Cabarrus Community College, Sep 1980.  

TECHNICAL INTERESTS AND EXPERTISE:

PROFESSIONAL SOCIETY INVOLVMENT:

American Society for Precision Engineering (ASPE) Board Member 2016-2018
            Director at Large, Chair of the Metrology Systems Committee

EMPLOYMENT HISTORY:

Chief Engineer: Center for Precision Metrology @ UNC Charlotte Mar 1993-Present - Responsibilities involve graduate student research consultation and design review, industrial project development, limited supervision of electronics and mechanical technicians, equipment training and repair, equipment budgeting and procurement specification, and general managerial oversight of various precision engineering focus laboratories such as metrology and computer integrated manufacturing. Laboratory renovation and expansion coordinator.  

Current Teaching Responsibilities: MEGR 7182, 8182 Machine Tool Metrology

Graduate Research Committees for thesis/dissertation:
    PhD: Lucas Valdez Dec 2015,  Improved measurement methods for in-process metrology on large scale components
    PhD: Mario Valdez Dec 2015, Task specific uncertainty for industrial measurements
    PhD: Neil Gardner, April 2007, Precision Geometric Metrology of Refractive Micro-lenses
    PhD: Dongmei Ren, Oct 2006, Optical Measurements of Dimensional Instability
    PhD: Lei Dong, Oct 2006, In-situ detection and heating of the high pressure phase of silicon during scratching

    Masters: Prashanth Jaganmohan, May 2017, Metrology Bench
    Masters: Harsh Patel, May 2016, A study of parameters influencing the vehicle wheel alignment measurements
    Masters: William Land II, June 2015, Characterization and in-process metrology of a laser powder fusion additive manufacturing machine
    Masters: Paul Anderson, Apr 2015, Sub-scale machining of large components
    Masters: Victoria Welty, Apr 2015, Dynamic evaluation of laser trackers
    Masters: Yue Peng, Mar 2015, Metrological evaluation of size specifications in ISO 144405-1
    Masters: Raunak Jadhav, Dec 2013, Error budget software for machine tools
    Masters: Kane Lingerfelt, Nov 2013, A study of modulated tool path machining and its effect on tool life in CNC turning operations.
    Masters: Wesley Love, Nov 2012,
Evaluating CNC machine tool dynamic performance for modulated tool-path (MTP) chip breaking
    Masters: Parik  Kulkarni, Nov2012
Evaluation of datum reference frame sensitivity and its effect on freeform metrology  
    Masters: Soumajit Dutta,  Aug 2008, Open Metrology Software
    Masters: Wichuda Chikosol, Dec 2007, Performance Testing of Cylindricity/Roundness Measuring Machine
    Masters: Prashanth Ramu, Dec 2007,  Error Evaluation and Uncertainty for a Five-Axis Multi-sensor, Coordinate
Measuring Machine
  
 Masters: David Winkowski: 2005, A high precision temperature controlled vacuum chamber for use in a dilatometer with sub-nanometer resolution.

STM Nanomemory Project, UNC Charlotte Aug 1989 - Dec 1992 Investigating the feasibility of producing a new type of memory with storage density 104 - 106 times greater than current technology. The project involved using scanning tunneling microscopy techniques to modify surfaces at the nanometer level. Other STM research included examining the wear pattern on cutting tools, process dependence of plasma enhanced chemical vapor deposition of germanium on silicon and diamond on silicon.  

Research Organizational Assistant, UNC Charlotte Jan 1989 - Aug 1989 Assisted Dr. Robert Hocken (Distinguished Professor) in the logistics involved in establishing the UNC Charlotte Precision Engineering Laboratory. Duties included technical diagramming for funded research, and writing specifications and contacting suppliers of research equipment, and other support functions.  Microelectronics Research, UNC Charlotte Sep 1986 - May 1988 Clean room fabrication of metal-oxide-silicon capacitors; parametrical testing using capacitance vs. voltage, conductance, and charge-capacitance techniques; obtaining doping profiles, and interface trap and oxide charge densities; bias temperature aging and hot carrier injection into oxides; data acquisition and computer programming.  

Physics Laboratory Instructor, UNC Charlotte Aug 1983 - May 1985 Teaching and grading an undergraduate middle level physics mechanics laboratory at UNCC.  

Electronics Tester and Troubleshooter, Western Electric Oct 1980 - Aug 1981 Structured testing of telephone trunk line system components with board level troubleshooting.  

PATENTS:

US# 6,782,596 "Fiducial calibration systems and methods for manufacturing, inspection, and assembly" Miller, Jimmie A., Aug 31, 2004
http://www.google.com/patents?q=6782596&btnG=Search+Patents

US# 7,073,239 "Fiducial calibration and method for assembling parts" Miller, Jimmie A., July , 11, 2006
http://www.google.com/patents?q=7073239&btnG=Search+Patents

US# 7,065,851 "Fiducial Calibration Method for measuring a workpiece" Miller, Jimmie A., June 27, 2006
http://www.google.com/patents?q=7065851&btnG=Search+Patents

US# 6,434,845 "Dual-axis static and dynamic force characterization device." Pereira; Paulo H. (Peoria, IL); Muralidhar; Ashok (Minneapolis, MN); Hocken; Robert J. (Concord, NC); Miller; Jimmie A. (Salisbury, NC); Smith; Stuart (Charlotte, NC). August 20, 2002.
http://www.google.com/patents?q=6434845&btnG=Search+Patents

TECHNICAL JOURNAL & REFEREED PUBLICATIONS:

Jimmie Miller, Two-dimensional matrix-based non-complex axis-of-rotation error modeling, Precision Engineering, (44) April 2016, Pp 93-108,
http://dx.doi.org/10.1016/j.precisioneng.2015.10.007  (http://www.sciencedirect.com/science/article/pii/S0141635915002111)
Datasets for Figures at http:dx.doi.org/10.17632/3bjr99z62n.1 

Jimmie Miller, Soumajit Dutta, Edward Morse and José Yague-Fabra , "Effective stylus diameter determination using near zero-width reference" Precision Engineering 35((3) 2011, p 500-504.
http://dx.doi.org/j.precisioneng.2011.02.003

P. Ramua, J.A. Yagüe, R.J. Hocken and J. Miller, "Development of a parametric model and virtual machine to estimate task specific measurement uncertainty for a five-axis multi-sensor coordinate measuring machine " Precision Engineering 35((3) 2011, p 431-9. 
http://dx.doi.org/j.precisioneng.2011.01.003 

Joao Bosco de Aquino Silva , Robert J. Hocken, Jimmie A. Miller, Gregory W. Caskey and Prashanth Ramu, "Approach for uncertainty analysis and error evaluation of four-axis co-ordinate measuring machines (CMMs)" 
 The International Journal of Advanced Manufacturing Technology: Volume 41, Issue11 (2009), Page 1130
http://dx.doi.org/10.1007/s00170-008-1552-z 
http://www.springerlink.com/content/n785p53m5r02n07h

Dongmei Ren, K M Lawton and Jimmie A Miller, "A double-pass interferometer for measurement of dimensional changes",  Measurement Science and Technology, 19/2 (2008) 531-534. (MST featured article)
http://dx.doi.org/10.1088/0957-0233/19/2/025303
http://www.iop.org/EJ/abstract/0957-0233/19/2/025303

Bethany A. Woody, K. Scott Smith, Robert J. Hocken, and Jimmie A. Miller, "A Technique for Enhancing Machine Tool Accuracy by Transferring the Metrology Reference From the Machine Tool to the Workpiece"  Journal of Manufacturing Science and Engineering -- June 2007 -- Volume 129, Issue 3, pp. 636-643 (2009 ASME Blackall Machine Tool and Gage Award)
http://dx.doi.org/10.1115/1.2716718  

Dongmei Ren, Kevin M. Lawton and Jimmie A. Miller, "Application of cat's-eye retroreflector in micro-displacement measurements" Precision Engineering, Vol 31, Issue 1, January 2007, Pages 68-71.
:http://dx.doi.org/10.1016/j.precisioneng.2006.02.002

S. Smith , B.A. Woody, J.A. Miller, "Improving the Accuracy of Large Scale Monolithic Parts Using Fiducials" Annals of the CIRP Vol. 54/1/2005, pp483-7.
http://dx.doi/S0007-8506(07)60150-4 

Lei Dong, John A. Patten, Jimmie A. Miller, "In-situ infrared detection and heating of metallic phase of silicon during scratching test" , Int. J. Manufacturing Technology and Management, Vol. 7, Nos. 5/6,  pp530-539 (2005)
http://dx.doi.org/10.1504/IJMTM.2005.007701

Miller, Jimmie. A., Hocken, Robert, Smith, Stuart T., and Harb, Salaam, "X-ray calibrated tunneling system utilizing a dimensionally stable nanometer positioner", Precision Engineering, 18(2/3), pp. 95-102 (1996).
http://dx.doi.org/10.1016/0141-6359(96)00037-2 

Varhue, W. J., Carulli, J. M., Peterson, G. G., and Miller, J. A., "Low temperature epitaxial growth of Ge using electron-cyclotron-resonance plasma-assisted chemical vapor deposition", J. Appl. Phys. 71(4), 1949, (1992).
http://dx.doi.org/10.1063/1.351189

Varhue, J., Carulli, J. M., Miller, J. A., and Peterson, G. G., "Surface morphology of epitaxial Ge on Si grown by plasma enhanced chemical vapor deposition", J. Vac. Sci. Tech. B 9(4) 2202 (1991).
http://dx.doi.org/10.1116/1.585770

Miller, Jimmie A. and Hocken, Robert J. "Scanning tunneling microscopy bit making on highly oriented pyrolytic graphite: initial results", J. Appl. Phys. 68(2), 905 (1990).
http://dx.doi.org/10.1063/1.346732

Miller, Jimmie A., Blat, Catherine, and Nicollian, Edward H.,"Accurate measurement of trivalent silicon interface trap density using small signal steady state methods", J. Appl. Phys. 66(2), 716 (1989).
http://dx.doi.org/10.1063/1.343544

CONFERENCE PROCEEDINGS

Miller, Jimmie, "Scope of Metrology Systems", Proceedings of the American Society for Precision Engineering Annual Meeting, Portland OR,  Oct 23-28, 2016, 65, pp140-5

Du J, Kang W, Bridges P, Miller JA,  "Experimental Verification of Alignment Related Errors in Position Metrology of Axes of Rotation", Proc ASPE 2015, 62, 474-9.

Miller, J. A.; Caskey, G. W.; Hocken, R. J.  "Optical alignement of SAMM to reduce cosine error" Proceedings of the ASPE 2011, 52, 238-41.

Ni, K.; Miller, J. A.; Hocken, R. J. ,"Metrology of a Precision Plasmonic Lithography Stage", Proceedings of the ASPE 2011, 52,  532-44

Miller JA, Saad ME-S, Caskey GW, Aguilar-Martin,  "Interferometric measurement of the low value  CTE of a ball bar", Proceedings of the ASPE 2010 Annual Meeting
http://www.aspe.net/publications/annual_2010/poster/05dim/3117.pdf

Ren, D. M., Lawton, K. M., Miller, J. A., Zhu, Z. Y., & Wan, Y. (2009). The design of the optical system in the balanced interferometers. Jiliang Xuebao/Acta Metrologica Sinica, 30(SUPPL. 1), 1-4. 10.3969/j.issn.1000-1158.2009.z1.01

D. Ren, J. A. Miller and K. M. Lawton, "Uncertainty in measurements of dimensional changes from an interferometric dilatometer", Proceedings of the ASPE 2007 Annual Meeting, Dallas, TX, pp. 340-343. http://www.aspe.net/publications/Annual_2007/POSTERS/3METRO/3MEASU/2233.PDF

Ren D., Lawton K.M. and Miller J.A., "Application of cat's-eye retroreflector in micro-displacement measurement", Proceedings of the ASPE 2005 Annual Meeting, vol (37), Oct. 9-14, 2005, Norfolk, VA, pp. 379-382.
http://www.aspe.net/publications/Annual_2005/POSTERS/4OPTICS/2OINTRF/1751.PDF 

Lei Dong, John A. Patten, and Jimmie A. Miller, "In-Situ Infrared (IR) Detection and Heating of the High Pressure Phase of Silicon During Scratching Test" in Surface Engineering 2004-Fundamentals and Applications, edited by Soumendra N. Basu, James E. Krzanowski, Joerg Patscheider, and Yury Gogotsi (Mater. Res. Soc. Symp. Proc. 843, Warrendale, PA , 2005), T6.5/R10.5

Woody, BA;S mith, KS; Hocken, RJ; Miller, JA "Uncertainty analysis for the Fiducial Calibration System" ASME International Mechanical Engineering Congress and Exposition, NOV 05-11, 2005 Manufacturing Engineering and Materials Handling, 2005 Pts A and B 16: 699-706 Part 1-2 2005 
http://dx.doi.org/10.1115/IMECE2005-81299 

Miller, Jimmie A, Morse, Edward P, Nettles, John A, Turner, Jeremy S, " Kite Square", Proceedings of the ASPE 2004 Annual Meeting, Oct 24-29, 2004, vol 34 (2004) pp 450-454.
http://www.aspe.net/publications/Annual_2004/POSTERS/3METRO/4MACHTM/1581.PDF 

Dong, Lei; Miller, Jimmie A; Patten, John A,; "In-situ infrared (IR) detection of the high pressure phase transformation of silicon during scratching test", Proceedings of the ASPE 2004 Annual Meeting, Oct 24-29, 2004, vol 34 (2004) pp 137-140.
http://www.aspe.net/publications/Annual_2004/PAPERS/7PMACH2/1443.PDF 

Patten, John A,; Dong, Lei; Miller, Jimmie A; "Electrical and optical detection and heating of the high pressure metallic phase of silicon during scratching with diamond and its effect on the material's hardness", Proceedings of the ASPE 2003 Annual Meeting, Oct 26-31, 2003, vol 30 (2003) pp 507-510.
http://www.aspe.net/publications/Annual_2003/PDF/5proc/2mach/1324.PDF  

Feng , Qibo; Hocken, Robert J.; Miller, Jimmie A.; "Quick and dynamic measurements of geometric errors of CNC machines", in Process Control and Inspection for Industry Proceedings of SPIE vol 4222 (2000) pp 110-113.
http://dx.doi.org/10.1117/12.403838

Miller, Jimmie A.; Hocken, Robert; Feng, Qibo; and Ramanan, Vignesh; "Foundation for Dynamic Metrology of Machine Tools" Proceedings of the ASPE 1999 Annual Meeting, Oct 31- Nov 4, 1999, in Monterey California.
http://www.aspe.net/publications/Annual_1999/POSTERS/METROL/MODEL/MILLER_J.PDF 

Salsbury James; Hocken, Robert; Miller, Jimmie; and Raja, Jay; "Graduate Level Education in Metrology", Proceedings of the 1999 NCSL Workshop and Symposium, July 1999, pp 351-362.

Hocken, R., and Miller, J. A., "Nanotechnology in metrology", Proceedings of the Fifth International Symposium on Robotics and Manufacturing, August 14-18, 1994 in Maui, Hawaii.

Hocken, R. et al., "Research in engineering metrology…" Proceedings of NSF Design and Manufacturing Conferences, 1993 and 1994.

Miller, J. A., Smith., S.T., "Tunneling current characterization: An application of an X-ray interferometric calibrated stage," Proceedings of the ASPE 1993Annual Meeting, Nov 1993, pp. 37-40.

Hocken, Robert J., and Miller,. Jimmie A., " Nanotechnology and its impact on manufacturing", Japan/USA Symposium on Flexible Automation ASME 1992, p 7ff.

Lavigne, C., Miller, J. A., and Hocken., R. J. , "A long range STM/AFM" Proceedings of the ASPE 1991 Annual Conference, Santa Fe, NM, Oct 1991.

Miller, J. A., Hocken, R., "Scanning tunneling microscopy bit-making for use in high density memory chip applications," Proceedings of the ASPE 1990 Annual Conference, Nov 1990, pp. 119-120.

PhD THESIS: "From STM to Nanomemory: A Transfer of Technology Feasibility Study". University of Warwick, Coventry, England, Engineering Dept., 1994.

MASTERS THESIS: "Negative bias temperature instability in wet and dry oxides". University of North Carolina Charlotte, Engineering Science Dept., 1987.

SOCIETY MEMBERSHIP Member of the American Society for Precision Engineering (ASPE).

HONORS AND AWARDS:

COMMUNITY INVOLVEMENT:  Currently a member of Concord Bible Church, Concord NC.